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静电放电保护器件性能测试技术研究 被引量:3

Research on Technique of Performance Test to ESD Protection Device
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摘要 为准确测试静电放电(ESD)保护器件的性能、解决ESD产生的辐射场及其高频反射对测试结果的影响,本文研制了基于微带设计和电磁场屏蔽理论的专用测试夹具,评价了该夹具的传输特性,建立了由高频脉冲模拟器、专用测试夹具和示波器等组成的测试系统.利用该系统测试了某型号ESD保护器件的限幅响应时间、箝位电压和峰值电流等性能参数.测试结果表明,该测试系统能够满足ESD保护器件性能测试要求,可广泛应用于ESD保护器件设计和优化研究. According to the problems of the effects of ESD radiation field and HF reflection on the testing results,a special test clamp,which is based on micro-strip design principle and electromagnetic field theory,was developed in order to meet the requirement of the accurate measurement of ESD protection device.The transmission characterization of the test clamp was tested.A testing system which composed of HF pulse simulator,special test clamp and oscilloscope was developed.Using the testing system,the response time,the clamping voltage and the peak current of a protection device were measured.The results showed that the test system could be used widely in the design and the optimization of the ESD protection device.
出处 《河北大学学报(自然科学版)》 CAS 北大核心 2010年第5期609-612,共4页 Journal of Hebei University(Natural Science Edition)
基金 国家自然科学基金资助项目(60971042) 国防科技重点实验室基金资助项目(9140C87020410JB3403)
关键词 静电放电 保护器件 测试夹具 传输线 ESD protection device test clamp transmission line pulse(TLP)
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参考文献5

  • 1HONDA M.New threat-EMI effect by indirect ESD on electronic equipment[J].IEEE Trans on Industry Application,1989 (25):939-944.
  • 2HOPEWELL N J.Bell labs engineers detect Invisible microcircuit killers[M].New Jersey:Lucent Technologies,Press Releases,1998.
  • 3刘尚合,魏光辉,刘直承,等.静电理论与保护[M].北京:兵器工业出版社,1999:180-184.
  • 4刘尚合 武占成.静电放电与危害防护[M].北京:北京邮电大学出版社,2004..
  • 5IEC 61340-3-1,2006.Methods for simulation of electrostatic effects-human body model[HBM] electrostatic discharge test waveforms[S].

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