ASIC可测试性设计技术

The Technology of Design for Testability for ASIC’s

可测性设计技术对于提高军用ＡＳＩＣ的可靠性具有十分重要的意义。结合可测性设计技术的发展，详细介绍了设计高可靠军用ＡＳＩＣ时常用的ＡｄＨｏｃ和结构化设计两种可测性技术的各种方法、优缺点及使用范围。其中，着重论述了扫描技术和内建自测试技术。

The technology of design for testability (DFT) is of great importance for enhancing the reliability of military ASIC’s. Several main techniques of DFT for ASIC’s are described, along with their advantages and disadvantages Scan method and built in self test(BIST) technique are discussed in particular.