细丝直径测量的双光束干涉法

Double-beam Interferometric Method to MeasureThin Wire Diameter

本文提出一种双光束干涉法测量细丝直径的方法．两束平行光波相向入射到细丝上，反射后形成两条虚线源，它们产生平直的条纹，条纹周期与丝径成反比．由ＣＣＤ摄取条纹图进入微机处理，给出细丝直径。文中将介绍该方法的原理和装置，给出相应的实验结果，并对其应用前景作简要的讨论．

A double-beam interferometric method to measure thin wire diameteris proposed in the present paper. Two plane light waves incidence upon the thinwire, two imaginary lines produced in light reflection can interference to give theparallel fringes, whose spatial period is proportional to the observation distance andinverse to the thin wire diameter. In this paper, we will explain the principle of thismethod and describe the experimental set-up in section 2. The experimental resultsare given in section 3. As well, a brief discussion about its application potential inthe concltlsion.