摘要
目的：腭化构音多见于早期手术后腭咽机能正常的腭裂患者及无器质性病变的语音障碍患者。本文以电腭图检测患者发音时舌腭接触状况，探讨腭化构音机理。材料与方法：分析４名腭裂修复术后腭咽闭合良好的腭裂患者及４名无器质性病变的腭化构音患者的电腭图和语音清晰度，并与３０名正常发音者对照。结果：腭化构音可降低语音清晰度，主要涉及辅音／ｓ／、／ｚ／、／ｃ／、／ｔ／、／ｊ／、／ｑ／等舌尖前音、舌尖中音、舌面音。电腭图图像显示舌腭接触较正常发音者广泛或／和靠后。结论：腭化构音时舌背卷曲，舌根、舌面上抬与腭部形成后接触，使被检音的音征表现发生变化。
Objective: Palatalized
misarticulation (PM) often occurs in patients with articulatory disorders whose velopharyngeal
function is sufficient.This paper is to study articulatory pattern of PM. Materials and Methods:
Four cleft palate patients suffering from PM with adequate velopharyngeal function after
palatoplasty and four functional misarticulation patients served for this study.As a control,thirty
children with normal speech were included.In this paper,the outcomes of electropalatography
and perceptual speech characteristics were analyzed. Result: Palatalized misatriculation
decreased the speech intelligibility,and lingualpalatal contact area was broader and/or was
more posterior than normal. Conclusion : PM was produced by the movementwith the posterior
tongue dorsum and middorsum elevated to make posterior palatal contact,which makes the
dental(/s/;/z/;/c/),alveolar(/t/)and palatal (/j/;/q/)sounds substitute by other sounds.
出处
《口腔颌面外科杂志》
CAS
1999年第2期103-105,共3页
Journal of Oral and Maxillofacial Surgery
关键词
腭裂
汉语
腭化构音
电腭图
Cleft palateChinesePalatal zed misat riculationElectropala to graphy
