用于电源管理单元的内建可测性设计

The Design of the Build-in Testability for Power Management Unit

电源管理单元内部集成多个LDO和Buck调整器,需要检测和控制众多的参数。本文以串并转换思想和引脚复用技术为基础,提出一种通用的内建可测性设计方法,不需要增加引脚数目,外围控制电路简单,内部测试电路规模小,可移植。芯片采用SMIC公司的0.35umCMOS混合信号模型设计,实现了内部电流比较器、电压比较器、振荡器、基准等多项指标的测量。本设计大大缩短芯片开发周期,减小芯片面积,进而降低研发成本。

There are many parameters to be detected and controlled during design a PMU with many LDOs and Buck regulators.Based on the technology of serial-parallel convertor and multi-function of Pad,this paper proposed a universal design of build-in testability which does not need additional Pad , can cooperate with simple external control structures and small internal test circuit,and easy to transplant. The chip used SMIC 0.35um CMOS mixed-signal process to design,succeeded to measure the electrical characteristics of current comparator,voltage comparator,oscillator , reference and so on.The design greatly shorten the period of the chip designing,reduce the area of the chip ,and then reduce the cost of the research.