STM探针对被测表面作用力的测量

MEASUREMENT OF THE FORCE APPLIED BY A SCANNING TUNNELING MICROSCOPE STYLUS ON THE MEASURED SURFACE

用石英振子频移法成功地对STM探针与被测表面间的作用力进行了测量 ,进一步证实了在二者之间存在作用力 。

With the technique of resonance frequency shift by using a quartz crystal resonator, the applied force of a STM stylus on a measured surface is successfully measured and the prediction that there exist an applied force between a STM stylus and the measured surface during the measurement. Thus a new means is provided whereby the essence of the phenomenon is explained.