基于多参数存储测试技术的智能事件记录仪的设计

Design of Intelligence Event Recorder Based on Multi-parameters Memorized Testing and Measurement Technology

介绍了一种基于AT89S52单片机所构成的多参数存储测试系统的智能事件记录仪样机,提高运输包装事件的分析能力。采用MTx传感器采集多参数数据,使用U盘为存储设备用以存储MTx(motion tracker)传感器采集到的大量多参数数据,并配备相应的软件用以绘制以时间为基轴的三维加速度、三维转角率、三维地磁场、温度等多参数的曲线图进行数据还原。文中给出了相应硬件电路以及下位机软件的设计,绘制出了数据还原的曲线图,成功验证了试验样机的可行性。

This paper introduced a kind of design for a prototype intelligence event recorder used on the composition of AT89S52 single chip microcomputer,and based on multi-parameters memory testing technology,improved the analysis skills of transport packaging events.It used MTx sensor to acquire multi-parameters data,used USB flash disk as storage device for storing a large number of multi-parameters data collected with MTx（motion tracker） sensor.Equipped with mapping software for time-based three-dimensional axis accelerometer,three-dimensional rotation rate,three-dimensional magnetic field and temperature parameters for data reduction curve.It presented the hardware circuitry,microcomputer software design,and gave the restore of data graphics to verity the feasibility of the prototype.