半导体器件失效案例统计与综合分析

The Statistics and Analysis of the Failure Cases of Semiconductor Components

电子元器件是电子产品最基本的组成部分,而半导体器件通常又是关键与核心器件;半导体器件失效数占电子元器件总失效数的一半以上。本文针对半导体器件的失效案例进行筛选、汇总,按照失效类别、失效模式和失效原因进行分类统计,并对统计数据进行分析;其结果可以为从事元器件质量管理、元器件研制、采购和整机设计人员在元器件研制、采购、试验、选用和使用等全过程控制半导体器件失效提供重要的参考数据。

Electronic components are the basic elements of electronic equipments, and the semiconductor components are usually the key components. But the failure of semiconductor components accounts 50% of whole failure of electronic components. In this paper, the failure cases of semiconductor components are screened and collected, and the statistics of the cases are conducted according to the failure type, failure mode and failure reason. The statistic data is analyzed and the result is useful to those people who are engaged in the quality control, development, procurement and use of electronic components to control the failure of electronic components.