基于点光源图像分析的料位测量方法

A Level Measurement Method Based on Analysis of Point Light Source

利用半导体光纤点光源设计研制了料位测量装置,通过采集和分析点光源照射物料表层形成图像的方法,实时检测随容器内物料的高低而不断变化的圆形光斑,然后分析光斑的直径或面积大小以求出料位值,并将该值与料位现场实景图像同时输出,以有效避免误导操作.实验结果表明,所提方法是可行和有效的.

A device of level measurement,which uses semiconductor optical point light source,is designed to calculate material level value by detecting changing optical circle in real-time and analyzing diameter or area of the optical circle.Then the material level value and real image of material scene of warehouse are output simultaneously to avoid misleading operator effectively.Experimental results show that the proposed method is feasible and effective.