基于在线测试的边界扫描器件测试原理

The Boundary Scan Device Testing Principle Based on Online Test

当今，微电子技术已进入集成电路（VLSI）时代。随着芯片电路的小型化及表面封装技术（SMT）和电路板组装技术的发展，使得传统测试技术面临着巨大的挑战。为了提高电路和系统的可测试性，提出了一种新的电路板测试方法——边界扫描测，也称JTAG标准。本文简单介绍基于BoundaryScan器件在ICT设备中测试原理。

Today,micro-electronics technology has entered the integrated circuit （VLSI） era.With the miniaturization of chip circuitry and surface mount technology （SMT） and circuit board assembly technology, the traditional testing technology faces enormous challenges.In order to improve the circuit and system testability, a new circuit board testing method - boundary scan test,also known as JTAG standard.This paper briefly describes the device based on ICT equipment BoundaryScan testing principle.