摘要
在对设计的功能验证中,断言常被用于检测设计错误.针对制造业的测试模式生成,提出了在寄存器传输层(RTL)用于无扫描设计的断言再用方法.这种方法减少了顺序自动测试码生成程序(ATPG)的搜索空间,因而能加快测试生成过程,增加故障覆盖率.通过实例分析,证明了该方法的可行性和效果.
Assertions are used in functional verification of design to detect design errors.In this paper we propose an approach for their reuse in manufacturing test pattern generation at Register-Transfer Level (RTL) for non-scan designs.The approach provides search-space reduction for sequential ATPG therefore potentially speeding up the test generation process and increasing the fault coverage.A discussed case-study demonstrates the feasibility and effectiveness of the proposed idea.
出处
《上海师范大学学报(自然科学版)》
2010年第5期441-447,共7页
Journal of Shanghai Normal University(Natural Sciences)
基金
supported in part by Estonian Science Foundation through grants 8478 and 7068
European Commission projects FP7-2009-IST-4-248613 DIAMOND and FP7-REGPOT-2008-1 CREDES
Research Centre CEBE funded by EU Structural Funds