期刊文献+

基于HICUM模型的高速锗硅异质结双极性晶体管可缩放模型研究(英文) 被引量:1

Scalable HICUM Model for High-Speed SiGe HBTs
下载PDF
导出
摘要 针对高速锗硅异质结双极性晶体管,在基于HICUM模型的基础上,建立了HICUM可缩放模型,并且在ADS和Hspice中都得到了很好的应用。可缩放模型是基于不同的尺寸的器件而建立的,所有可缩放模型中的参数都是直接从不同尺寸器件的测量数据中取得的,并且通过比较直流、电压电容关系、截止频率和S参数的测量和仿真数据,可以看出拟合结果比较好,HICUM可缩放模型得到了很好的验证。 A scalable HICUM model for high-speed SiGe HBTs is developed based on HICUM model.This model is well applied to simulation software of ADS and Hspice.The scaling is mainly based on different physical dimension of individual devices,all the scalable parameters in the scalable equations are extracted directly from the measurement data of various geometry.The correctness of this scalable model is further verified by the quite good fit between measured and simulated results on DC,CV,Ft and S parameters at the frequency up to 30 GHz.
出处 《电子器件》 CAS 2010年第5期561-564,共4页 Chinese Journal of Electron Devices
基金 国家科技重大专项资助(2009ZX02303-005)
关键词 可缩放模型 锗硅HBT HICUM模型 scalable model SiGe HBT HICUM model
  • 相关文献

参考文献8

  • 1Schroter M,Friedrich M,Rein H M.A Generalized Integral Charge-Control Relation and Its Application to Compact Models for Silicon Based HBTs[J].IEEE Trans Electron Dev,1993,40:2036-2046.
  • 2Berger D,Cell D,Schr(o)ter M,et al.Hicum Parameter Extraction Methodology for a Single Transistor Geometry[C]//IEEE Bipolar Circuits and Technology Meeting,2002:116-119.
  • 3Dominique Berger,Didier Celi.A Novel Method for Transit Time Parameter Extraction Taking Into Account the Coupling Between Dc and Ac Characteristics[C]//HICUM User ' s Meeting,Minneapolis.MN.DM01.161.
  • 4Ardouin B.Direct Method for Bipolar BE and BC Capacitance Splitting Using High Frequency Measurements[C]//IEEE BCTM,2001:114-117.
  • 5Ardouin B.Transit Time Parameter Extraction for the HICUM Bipolar Model[C]//IEEE BCTM,2001:106-109.
  • 6Cell D,Berger D.Direct Extraction of BC weak Avalanche HICUM Model Parameters[C]//HICUM User ' s Meeting,Minneapolis.DM01.159.
  • 7Takako Nakadai,Kenji Hashimoto.Measuring the Base Resistance of Bipolar Transistors.IEEE BCTM,1991,8(4):200-203.
  • 8Agilent Technology."ICCAP 2008".

引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部