摘要
本文报导当在室温下向非晶硅(a-Si)表面溅射钼(Mo)的过程中,Mo与非晶硅发生互作用的现象。该互作用要求一定的临界溅射功率与钼层厚度。其作用速率在a-Si界面为反应速率限制,而在与Mo交界面则为扩散速率限制。互作用生成非晶态钼硅Mo:a-Si合金。它可阻止铝(Al)向a-Si中扩散,同时可改善a-SiTFT的接触特性。当用Al/Mo作a-Si薄膜晶体管(a-SiTFT)的源和漏电极时,可提高开关电流比达7~8个数量级。
The reaction between a Si and Molybdnum (Mo) has been occurred during sputtering the Mo film on a Si at room temperature.This kind of reaction needs a critical sputtering power and time for formatting the a Si:Mo alloy.The reaction is diffusion rate limit near the interface of Mo/a Si:Mo alloy,but at the interface of a Si:Mo/a Si the reaction is reaction rate limit.The a Si:Mo alloy can prevent the Al diffusing into a Si and is a high conductive material.It can improve the contact characteristics of a Si TFTs and use as a good source and drain electrode material of double redundant structure with Mo and Al.The TFT of ratio of I on / I off with 7~8 order of magnitude have been obtained.
出处
《光电子.激光》
EI
CAS
CSCD
1999年第2期102-106,112,共6页
Journal of Optoelectronics·Laser
基金
国家自然科学基金
天津市21世纪青年基金