摘要
分析了单片机系统大容量存储的方法,提出了在存储测试系统中采用SD卡实现基于51内核单片机的大容量数据存储系统设计方案,介绍了单片机利用CH376实现对SD卡读写操作的工作原理和软硬件方法.该系统设计具有移植性好、可靠性高、数据回收便利等特点,并能实现低功耗要求,有利于扩大存储测试系统的应用领域.
The high density data storage method is analyzed.Then the paper introduces a scheme that SD card is applied to the mass-storage testing system.The principle of the CH376 working as Master of SD card is described in detail.Corresponding circuit diagram and software flow of the mass-storage testing device are described.The data acquired in SD card is easy to upload to computer with USB interface.The portability and reliability are typically characteristic of the design.It will expand the usage of storage testing device.
出处
《陕西科技大学学报（自然科学版）》
2010年第5期97-101,共5页
Journal of Shaanxi University of Science & Technology
关键词
存储测试
大容量存储
SD卡
CH376
SPI
storage testing
high density data storage
secure digital memory card
CH376
SPI
