摘要
针对电路测试点优化问题,研究了相关性模型和信息熵理论,在对相关性模型进行改进的基础上,建立了基于信息熵的电路测点优化策略,给出了具体的计算步骤。应用实例表明,该方法是有效的,可应用于模拟、数字和混合信号电路的故障检测及可测试性设计。
Directed towards the test point selection problem for circuit,researched the dependency matrix and information entropy theory.This paper presented an optimal strategy of test point selection for circuit based on information entropy after the improving of dependency matrix,and gave the detailed process of calculation.The application example shows that the method is feasible,and it can be applied to fault diagnosis and design for testability of analog,digital and mixed circuit.
出处
《计算机应用研究》
CSCD
北大核心
2010年第11期4149-4151,共3页
Application Research of Computers
关键词
故障诊断
可测试性设计
信息熵
测点选择
fault diagnosis
design for testability
information entropy
test point selection
