摘要
采用Ｘ射线衍射（ＸＲＤ）、透射电子显微镜（ＴＥＭ）和电阻－温度曲线等方法研究了近等原子的富ＴｉＴｉＮｉ合金薄膜的析出相和相变等特征，并对结果进行了详细讨论。
Some features of precipitated phases and phase transformation in thin films of the Tirich TiNi alloy have been using Xray diffraction,transmission microscopy and resistance transition method. The results are discussed in detail.
出处
《稀有金属材料与工程》
SCIE
EI
CAS
CSCD
北大核心
1999年第2期89-92,共4页
Rare Metal Materials and Engineering
关键词
溅射
形状记忆合金
薄膜
相变
析出相
precipiated phase,phase transformation,sputter,TiNi shape memory alloy
