摘要
研究了低温下分子束外延生长GaAs(LTG-GaAs)样品的稳态和瞬态发光.从200℃生长的样品中可测到很弱但清晰可辨的稳态发光峰,峰的能量位置相对于体GaAs激子峰有一定蓝移.此外,发现在体GaAs上生长LTG-GaAs薄膜可大大减小体GaAs衬底材料中本征发光的衰减时间,但对(e,A°)发光影响不大.用上转换方法对退火和未退火LTG-GaAs样品瞬态发光进行了测量,获得了关于LTG-GaAs中复合中心和陷阱中心的信息.
The steady state and transient photoluminescence (PL) of molecular beam epitaxial (MBE) low temperature grown (LTG) GaAs samples are investigated. A weak but well distinguished steady state PL peak is detected from LTG GaAs.Its peak energy has a blue shift relative to the excitonic PL peak of bulk GaAs. Furthermore, it is confirmed that the decay time of the intrinsic luminescence from bulk GaAs substrate is strongly reduced by the top LTG GaAs layer, while no essential change occurs for the impurity related (e, A°) luminescence. The transient PL of LTG GaAs without and after annealing is measured by using up conversion technique. The information about recombination and trapping centers are obtained.
出处
《发光学报》
EI
CAS
CSCD
北大核心
1999年第1期7-10,共4页
Chinese Journal of Luminescence