摘要
对不同硫含量的16MnR(HIC)中厚板进行HIC试验及夹杂物分析,结果表明:16MnR(HIC)的氢致裂纹敏痞性随S含量(硫化物夹杂)增加而增强,硫化物夹杂达到2.0级仅出现氢鼓泡,大于2.0级开始出现氢致裂纹以及氢鼓泡,小于0.5级抗氢致裂纹性能优良。
HIC test and inclusion analysis are carried out to 16MnR heavy and medium plate with different S contents, the results show that HIC sensitivity of 16MnR grows with increase of S content (sulphide inclu-sion). Hydrogen blistering occurs when sulphide inclusion reaches class 2.0, HIC and hydrogen blistering oc-cur when sulphide inclusion is greater than class 2. 0 and HIC resistance is excellent when it is lower than class 0.5.
出处
《宽厚板》
1999年第2期9-12,共4页
Wide and Heavy Plate
