组合电路内部故障及多故障测试

TEST FOR INTERNAL FAULT AND MULTIPLE FAULT OF COMBINATIONAL CIRCUIT

给出了用一阶布尔差分法的扩展来求组合电路内部单故障测试集的方法；同时也讨论了如何用高阶布尔差分法来求组合电路的多故障测试集，进而给出了求组合电路双重故障测试集的４个公式。

This paper presents a method for seeking out the testing set of a single internal fault of combinational circuits with developed first degree Boolean difference and the testing set of multiple faults of combinational circuits with multiple degree Boolean difference.Four formulas are given to seek out a testing set for double faults in combinational circuits.The fault testing set of concrete circuits is analyzed.