高速采样示波器校准技术的进展——兼论可溯源电器波形校准量值传递链路

Progress in high-speed sampling oscilloscope calibration yechnique——On quantity transfer chain for traceable waveform standard calibration

本文综述了发达国家近十年来在高速采样示波器校准方面所取得的重要进展。简要描述了基于脉冲太赫兹光谱产生超快电脉冲和利用光电采样技术重构超快电气波形的原理。对当前国际上流行的两种方案的优缺点作了评述,给出了基于脉冲太赫兹光谱实现超快(脉冲)波形量值可溯源链路。

In this paper, we survey the key progress in high-speed sampling oscilloscope calibration technique in the developed countries over last ten years. The principles generating the ultra-fast waveform based on the pulse-teratents spectroscope and reconstructing the one using elec-optic sampling（EOS）technique are described briefly. Three National Metrology Institute, namely, the National Physical Laboratory（NPL）, the Physikalisch-Technische Bundesanslalt （PTB）, and the National Institute of Standards Technology（NIST） ,have developed Elec-optic techniques for the characterization of ultra-fast sampling oscilloscopes. We review also the advantage and disadvantage for the current two schemes and present implementing traceable chain for ultra-fast waveform calibration based on pulse-terahents spectroscope.