摘要
应用电子显微技术,研究了以纳米碳管为媒介生长的SiO2晶须的形貌及其微结构特征,这些晶须为六角结构的。α-SiO2;直径为数十纳米,长度可达100μm以上,生长方向一般为[11-20]方向,且在校面方向上存在互成120°的面缺陷.
SiO2 whiskers with diameter from a few to a few tens of nanometers and length up to 100pm have been produced from SiO2 through a reaction with carbon nanotubes as reaction medium.Morphological and structural aspects and element composition of these as-grown SiO2 whiskers were inveStigated by means of transmission electron microscopy (TEM), X ray energy dispersive spectrometer (EDS) and electron energy loss spectrometer (EELS). The results showed that these nano-whiskers grew rather straight and with a uniform diameter for single whiskers. though sometimes they have branches.Tilting series of electron diffraction patterns (EDPs) of the whiskers have revealed that they are single crystals with a simple hexagonal structure and its lattice parameters fit to that of α-SiO2 very well.There are some plane defects in these as-grown whiskers, which parallel to the prismatic planes of the hexagonal structure and form an angle of 120° to each other.
出处
《材料研究学报》
EI
CAS
CSCD
北大核心
1999年第3期305-308,共4页
Chinese Journal of Materials Research
基金
国家自然科学基金!59872030
浙江省自然科学基金!9-597004