扫描近场光学显微术对InGaP微盘发光模式的研究

STUDY OF LIGHT EMITTING MODES OF InGaP MICRODISKS BY USING SCANNING NEAR FIELD OPTICAL MICROSCOPY

采用反射式扫描近场光学显微技术分别对直径为５μｍ和１０μｍ的图钉式ＩｎＧａＰ光学微盘进行了形貌和光致发光的近场图样测量和研究，并与由常规光学荧光显微镜测得的荧光图象相比较．结果表明ＩｎＧａＰ微盘的近场发光图样不仅反映出荧光图象的回音壁模式特征，即沿微盘周界显示为一圈红色亮环，而且证实荧光图像中的红色亮环实际上与更精细的由分立的周期性亮点组成的近场光场分布相对应．结合微盘内部与外部的近场分布可以获得光学微盘中发光模式的重要信息．

Using scanning near field optical microscopy, the photoluminescence of InGaP microdisks with radius about 5μm and 10μm, respectively, was acquired. Compared with far field fluorescence images, which show a bright red emission of fluorescence around the circumference of the microdisks, the near field fluorescent images contain much more details of the mode structure of the light distribution. The main characteristics were found to be whispering gallery mode from both the near field and far field images. As a very rapidly grown new technology, scanning near field optical microscopy provides us very important information for the study of the light emitting mode of the optical microdisks.