摘要
采用反射式扫描近场光学显微技术分别对直径为5μm和10μm的图钉式InGaP光学微盘进行了形貌和光致发光的近场图样测量和研究,并与由常规光学荧光显微镜测得的荧光图象相比较.结果表明InGaP微盘的近场发光图样不仅反映出荧光图象的回音壁模式特征,即沿微盘周界显示为一圈红色亮环,而且证实荧光图像中的红色亮环实际上与更精细的由分立的周期性亮点组成的近场光场分布相对应.结合微盘内部与外部的近场分布可以获得光学微盘中发光模式的重要信息.
Using scanning near field optical microscopy, the photoluminescence of InGaP microdisks with radius about 5μm and 10μm, respectively, was acquired. Compared with far field fluorescence images, which show a bright red emission of fluorescence around the circumference of the microdisks, the near field fluorescent images contain much more details of the mode structure of the light distribution. The main characteristics were found to be whispering gallery mode from both the near field and far field images. As a very rapidly grown new technology, scanning near field optical microscopy provides us very important information for the study of the light emitting mode of the optical microdisks.
出处
《红外与毫米波学报》
SCIE
EI
CAS
CSCD
北大核心
1999年第3期219-224,共6页
Journal of Infrared and Millimeter Waves
基金
国家自然科学基金
关键词
扫描近场光学
显微技术
微盘型
铟镓磷
发光模式
scanning near field optical microscopy, microcavity, whispering gallery mode, InGaP microdisk.