C_(60/70)薄膜与碘掺杂薄膜的椭偏光谱研究

ELLIPSOMETRIC SPECTRA OF UNDOPED AND IODINE DOPED C 60/70 FILMS

采用真空蒸镀的方法在玻璃、石英和硅衬底上制备了Ｃ６０／７０薄膜样品，膜厚范围在１５０～７００ｎｍ．用自制的高精度、自动化光度法椭偏光谱仪在２３０～６００ｎｍ波谱范围内测量了掺碘前后Ｃ６０／７０薄膜的椭偏光谱．用洛伦兹振子模型分析了这些椭偏光谱，得到了洛伦兹线型参数值Ｅ０、Ｅｐ、和Γ。

Some C 60/70 thin films on glass, quartz and silicon substrates were prepared by evaporation. The thickness of these films was 150nm￣700nm. The ellipsometric spectra of undoped and iodine doped C 60/70 film samples were measured in the wavelength range of 230nm￣600nm by an automatic spectroscopic ellipsometer. These spectra were analyzed by the Lorentzian model, and the parameters E 0,E p and Γ of Lorentzian lineshapes were obtained. The result has been compared with those of undoped and K doped C 60/70 films measured by other authors.