摘要
基于平面近场天线测量的基本理论,以半波偶极子阵列天线为模型,利用数值分析的方法研究了平面近场天线测量中的有限扫描面截断误差、位置误差和暗室环境误差对天线方向图副瓣特性的影响;并用自比较法实测了探头和AUT之间多次耦合的影响;给出了有探头补偿时由近场数据确定天线远场方向图的计算公式和OEWG探头的E面和H面方向图。通过与理论结果比较,得出了上述5项误差源产生的误差及其范围,即测量天线方向图副瓣的不确定度大小。该研究为近场天线测量技术的误差分析和补偿提供了一定的理论依据。
This paper is based on the basic theory of planar near-field antenna measurement technology,the effects of the finite scanning plane truncation errors,location errors and room scattering errors on the characteristics of antenna sidelobe in planar near-field antenna measurement are studied through numerical method by a mode of a dipole antenna array.The effect of multiple reflections between probe and AUT is measured by self-comparison method,the expres-sion for the far-field pattern driven by near-field data with probe-compensated are given.The OEWG probe＇s E-plane and H-plane pattern are also given.Compared with the theoretical result,the boundary of the errors are given and obtain the uncertainty of antenna pattern.This study provides some theory proof for the error analysis and compensation of the plane near-field antenna measurement.
出处
《电子测量与仪器学报》
CSCD
2010年第11期987-992,共6页
Journal of Electronic Measurement and Instrumentation
基金
国家重点实验室基金项目(编号:60671056)资助项目
关键词
天线测量
误差分析
平面近场测量
探头补偿
antenna measurements
errors analysis
plane near-field measurements
probe-compensated
