d-叉树k-FT结构的可靠性分析及冗余单元的分配

Reliability analysis and redundant elements allocation in k FT architectures of the d ary tree

随着芯片面积的增加及电路复杂性的增强，系统的可靠性逐渐下降．为了保证有较高的可靠性，人们将容错技术引进了集成电路的设计中．文中分析了ｄ－叉树的ｋ－ＦＴ结构的可靠性，同时讨论了如何分配冗余单元才能使系统具有较高可靠性的问题．

An increase in chip area and circuit complexity leads to a decrease in the system reliability. In order to get a better reliability, the fault tolerant technique is introduced into the IC design. In this paper, the reliability in k FT architectures of the d ary tree is analysized, and the problem of how to allocate redundant elements in order to make the system have a better reliability is discussed.