摘要
光学玻璃的应力使其出现双折射性质,严重影响成像质量和导致波面形变,因此需要进行精确定量的测量。为了满足高精度玻璃应力测量的需求,文章提出了一种测量应力的新方法:在光谱扫描法测量系统的基础上,加入半波片作为延迟量基准,根据插入被测玻璃前后延迟量的变化,精确、定量地得到被测玻璃的应力。实验测量了1块立方体玻璃不同区域的应力。分析表明,光谱扫描精度为0.25nm时,系统测量误差小于0.4nm。
Birefringence properties of optical glass caused by stress would adversely affect the image quality and lead to wave-front deformation,thus it needs precise quantitative measurement.To meet the demand for high-precision glass stress measurement,a new method for measuring stress is proposed,i.e.to add half-wave plate as the baseline delay based on the traditional spectroscopic measurement system.The stress of glass would be measured accurately and quantitatively by measuring retardation after the glass inserted.Stress in a cube of glass is measured in different regions.Analysis of the experiment shows that when the accuracy of 0.25nm spectral scans,the system measurement error is less than 0.4nm.
出处
《常州工学院学报》
2010年第4期62-65,共4页
Journal of Changzhou Institute of Technology
关键词
光学玻璃
光谱方法
应力测量
optical glass
spectroscopic method
stress measure