新型全电介质平板结构负折射性能的模拟分析

Numerical Simulation of Negative Refractive Property in Novel All-Dielectric Plate Structure

利用全电介质材料,设计了一种新型的高介电质平板-普通介电质-高介电质平板结构.该平板结构中入射电磁波激发的位移电流取代金属材质左手材料中的传导电流,在特定的激发模式下可以产生负折射现象.利用提取的有效介质参数和楔形棱镜模拟证实了这种全电介质结构的左手性能,并研究了高介电质平板尺寸变化对负折射率通带的影响.用具有高介电系数的介电质材料构筑左手材料可以克服传统的基于金属基元的左手材料在红外和太赫兹波段面临的结构复杂和损耗问题,为高频低损电磁超介质的开发提供一种新的结构设计思路.

A novel ＂high dielectric-general dielectric-high dielectric＂ plate structure is designed by using dielectric materials.For all dielectric structures,the displacement current induced by the incident electromagnetic wave can replace the conduction current in metal structure and excite specific resonance mode to result in negative index of refraction.The extracted effective medium parameters and the simulation of wedge-shaped prism confirm the left-hand property in all dielectric structures.The dependence of left-handed transmission band on the geometrical parameter of the high dielectric plate is also investigated.Using the high-dielectric material to build left-handed materials can overcome the limitations of structural complexity and high losses in metal-based left-handed materials,consequently providing a new design idea for high-frequency and low-loss electromagnetic metamaterials.