期刊文献+

32位MIPS处理器可测性设计与实现 被引量:1

Design for Testability of a 32-Bit MIPS Processor and Its Implementation
下载PDF
导出
摘要 设计了一个32位MIPS处理器。为实现负载均衡和提高系统利用率,采用自定义的5级流水线结构,并采用数据旁路机制和基于历史的分支预测机制来解决流水线冲突。同时,为保证芯片设计的可靠性和可测性,采用流水线分级验证的可测性设计方法,在设计中提取流水阶段的关键信号作为输出。为减小芯片面积和管脚数目,设计了多模式的工作机制,实现了芯片管脚复用。后仿结果表明,基于0.18μm CMOS工艺,处理器可工作于60 MHz频率。芯片核心面积为1.15 mm×2.25 mm,等效门为13.5万,功耗为2.8 mW/MHz。测试结果表明,芯片可在多工作模式之间正常切换,功能完整。 A 32-hit MIPS processor was presented. To realize load balance and increase system efficiency, a custom five-stage pipeline structure was employed. Furthermore, data bypass and branch prediction based on history records were adopted to solve hazards of pipelined processor. In order to ensure reliability and testability, stage decomposition checking was used. Key signals of the pipeline stages were extracted as output signals. Meanwhile, multiple modes were proposed and reusing of pads were achieved to reduce chip area and number of pads. Post-layout simulation based on 0. 18μm CMOS technology indicated that the processor had a maximum frequency of 60 MHz. Having 135 k gates, the core circuit occupies a chip area of 1.15 mm×2.25mm. With a total power con sumption of 2, 8 mW/MHz, the processor functions perfectly and switches properly between multiple modes.
出处 《微电子学》 CAS CSCD 北大核心 2010年第6期782-786,791,共6页 Microelectronics
基金 国家自然科学基金资助项目(60871005) 教育部博士点基金(新教师基金)资助项目(200800031073)
关键词 MIPS处理器 数据旁路 分支预测 可测性设计 MIPS processor Data bypass Branch prediction Design for testability
  • 相关文献

参考文献10

  • 1KOO H M, MISHRA P. Functional test generation using property decompositions for validation of pipelined processors [C] // Des Autom and Test in Eu rope. Munich,Germany. 2006:1240-1245.
  • 2DAVID A P,JOHN L H. Computer organization and design: the hardware/software interface [M]. 3rd Eel. Beijing: China Machine Press, 2006: 282-289.
  • 3DAVID A P, JOHN L H. Computer architecture: a quantitative approach [M]. 4th Ed. Beijing: China Machine Press, 2007:8-13.
  • 4SWEETMAN D. See MIPS Run[M].San Diego: Academic Press, 2002: 21-27.
  • 5REAZ M I, ISLAM M S, SULAIMAN M S, et al. A single clock cycle MIPS RISC processor design using VHDL [C] // Int Conf Semieond Elec. Orlando, Florida,USA. 2002 : 199-203.
  • 6MIPS Technologies, Inc. MIPS32TM architecture for programmers Volume II: The MIPS32TM instruction set [Z]. 2002: 22-29.
  • 7SAMIHA M, YERVANT Z. Principles of testing electronic systems [M]. Beijing: China Machine Press, 2007: 1-15.
  • 8李瑛,高德远,张盛兵.RISC微处理器流水线的测试[J].小型微型计算机系统,2005,26(6):1110-1112. 被引量:6
  • 9LEE I, LEE D, CHOI K. ODALRISC: A small, low power,and configurable 32 bit RISC processor [C]// Int SoC Design Conf. Busan,Korea. 2008: 25-26.
  • 10PINCKNEY N, BARR T, DAYRINGER M, et al. A MIPS R2000 implementation [C] // Des Aurora Conf. New York, NY,USA. 2008 : 102-107.

二级参考文献7

  • 1Thatte S M, Abraham J A. Test generation of microprocessors [J]. IEEE Transactions on Computers, 1980, C-29(6):429-441.
  • 2Brahme D, Abraham Jacob A. Functional testing of micro-processors[J]. IEEE Transactions on Computers, 1984, C-33(6):475-485.
  • 3闵应骅 HuSYH.微处理机的功能测试[J].应用科学学报,1984,2(2):162-169.
  • 4A J van de Goor, Verhallen T J W. Functional testing of current microprocessors (applied to the Intel i860TM)[C]. In: International Test Conference, 1992, 684-659.
  • 5Lee David C, Siewiorek Daniel P. Functional test generation for pipelined computer implementations [C]. In: Fault Tolerance Computing Symposium, 1991: 60-67.
  • 6Iwashita H, Kowatari S, Nakata T, Hirose F. Automatic test pattern generation for pipelined processors[C]. In: International Conference on Computer-Aided Design, 1994: 580-583.
  • 7Myers G J, Budde D L. The 80960 microprocessor architecture[M]. New York: John Wiley and Sons, Inc. , 1988.

共引文献5

同被引文献3

引证文献1

二级引证文献2

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部