摘要
This paper presents the design and implementation of a 14-bit, 100 MS/s CMOS digital-to-analog converter （DAC）. Analog background self-calibration based on the concept of analog current trimming is introduced. A constant clock load switch driver, a calibration period randomization circuit and a return-to-zero output stage have been adopted to improve the dynamic performance. The chip has been manufactured in a SMIC 0.13-μm process and occupies 1.33 × 0.97 mm2 of the core area. The current consumption is 50 mA under 1.2/3.3 V dual power supplies for digital and analog, respectively. The measured differential and integral nonlinearity is 3.1 LSB and 4.3 LSB, respectively. The SFDR is 72.8 dB at a 1 MHz signal and a 100 MHz sampling frequency.
This paper presents the design and implementation of a 14-bit, 100 MS/s CMOS digital-to-analog converter （DAC）. Analog background self-calibration based on the concept of analog current trimming is introduced. A constant clock load switch driver, a calibration period randomization circuit and a return-to-zero output stage have been adopted to improve the dynamic performance. The chip has been manufactured in a SMIC 0.13-μm process and occupies 1.33 × 0.97 mm2 of the core area. The current consumption is 50 mA under 1.2/3.3 V dual power supplies for digital and analog, respectively. The measured differential and integral nonlinearity is 3.1 LSB and 4.3 LSB, respectively. The SFDR is 72.8 dB at a 1 MHz signal and a 100 MHz sampling frequency.
基金
Project supported by the National High Technology Research and Development Program of China(No.2009AA011605)
