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Effects of channel-substrate interface on hysteresis of sidegating effect in GaAs MESFETs

Effects of channel-substrate interface on hysteresis of sidegating effect in GaAs MESFETs
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摘要 With sidegating bias,hysteresis of sidegating effect is usually observed in drain current.The experimental results presented in this letter demonstrate that the hysteresis with time-based characteristics is closely related to EL2 traps and channel-substrate(C-S)junction peculiarities.The response of depletion region of C-S junction to the electron capture and emission by trap-EL2 plays an important role in the hysteresis.Furthermore,a new mechanism is proposed to explain the time-based characteristics of hysteresis,i.e.,there is a "steady-state" in which the hysteresis disappears. With sidegating bias, hysteresis of sidegating effect is usually observed in drain current. The experimental results presented in this letter demonstrate that the hysteresis with time-based characteristics is closely related to EL2 traps and channel-substrate (C-S) junction peculiarities. The response of depletion region of C-S junction to the electron capture and emission by trap-EL2 plays an important role in the hysteresis. Furthermore, a new mechanism is proposed to explain the time-based characteristics of hysteresis, i.e., there is a "steady-state" in which the hysteresis disappears.
出处 《Chinese Science Bulletin》 SCIE EI CAS 2010年第34期3950-3953,共4页
关键词 旁栅效应 MESFET GAAS 界面效应 迟滞 通道 俘获反应 交界地区 GaAs MESFET, sidegating bias, hysteresis, channel-substrate interface
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