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SnO_2纳米粒子膜的性质和结构研究 被引量:9

Characterization of SnO_2 Nanoparticulate Film
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摘要 用胶体化学法制得的SnO2水溶胶在其与空气的界面上能自发形成一层固态膜,将陈化不同时间的界面膜转移出来,采用紫外-可见光谱、X光电子能谱、椭圆偏振、TEM以及AFM等手段进行了表征。结果发现:界面膜有一个从无到有、达到稳定的过程,稳定时膜厚约为20nm;采取垂直方式转移出来的膜质量较好,致密、粒子分布均匀、团聚程度小;膜中SnO2纳米粒子是非化学计量比的,存在大量氧空位,随膜在空气中放置时间的增长,氧空位逐渐减少。 A film was found to be formed at the air-SnO2 hydrosol interface only by aging thehydrosol in air by Brewster Angle Microscopy technique. Development of surface pressure withaging time showed that the film took 500min to be formed completely. The films aged fordifferent time were transferred onto different substrates such as CaF2, silicon, mica and coppergrid (400 mesh ) etc. by LB transfer device. The transferred films were characterized byUV-Vis spectroscopy, X-Ray photoelectron spectroscopy, Ellipsometry, TEM and AFMtechniques. The results show: The film was SnO2 nanoparticulate film exactly. The filmtransferred by vertical mode was better than that transferred by horizontal mode. The film agedfor sh and transferred by vertical mode was uniform and compact. The thickness of the filmwas about 20 nm. The nanoparticles in the film were non-stoichiometry caused by oxygendeficiency. The film was stable in short time and then the nanoparticles in the film gatheredgradually with the time going.
出处 《Chinese Journal of Chemical Physics》 SCIE CAS CSCD 1999年第2期191-196,共6页 化学物理学报(英文)
基金 国家自然科学基金
关键词 纳米粒子 薄膜 结构 性质 二氧化锡 半导体 SnO_2 Nanoparticulate film Characterization
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二级参考文献5

  • 1彭笑刚,1992年
  • 2Chung W Y,Thin Solid Films,1992年,221卷,304页
  • 3李津如,1990年
  • 4殷锐,1990年
  • 5Zhao X K,J Phys Chem,1990年,94卷,2573页

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