摘要
本文介绍了对用于空间行波管的M型阴极进行的寿命试验。阴极寿命试验的载体选用普通玻璃二极管与电子枪,用于试验的M型阴极在40支普通玻璃二极管中的累计试验时间已经超过681000 h,在16支电子枪和2支行波管中的累计试验时间已经超过275000 h。对阴极的钡蒸发测量表明在空间行波管的工作年限内,M阴极主要受到膜层退化的影响,而一般不会出现钡耗尽的问题。因此基于电子枪寿命试验的数据,由膜层退化导致的阴极实际功函数增加,得出了M型阴极寿命模型,并对一定工作条件下的阴极寿命时间进行推算。同时作者发现:对于长期的阴极寿命试验,普通玻璃二极管不能有效保持其内部真空度,阴极发射下降较快;在电子枪中,阴极发射稳定。电子枪更适合作为阴极寿命试验的载体。
This paper presents a serial of life tests of cathode for space TWTs in BVERI.Both common glass diodes and electron guns were used as cathode life test vehicles.The accumulated life time of 40 diodes was more than 681,000 hours,and the time of the 16 electron guns and 2 space TWTs were more than 275,000 hours.The measuring of barium evaporating indicates that the M cathode made by BVERI used in space TWT is mainly influenced by the film degradation,but the exhausting of the barium won't occur.Referring to the changing of the cathode's work function,the authors give the life model of the cathode for space TWT based on the data resulting from the E-guns and figure out the life time of the cathode under several work conditions.The authors also found that the glass diode can't keep the vacuum inside,electron emission of the cathode descend rapidly.The electron gun is competent for the life-test vehicles.
出处
《真空电子技术》
2010年第5期37-43,共7页
Vacuum Electronics