摘要
本文利用光电子能谱(XPS)和质谱(MS)研究了12种有机锡化合物。通过XPS和MS讨论了化合物中取代基对锡内层电子的影响及对SnO键的影响。结果表明XPS和MS对有机锡化合物某些化学键性质的讨论具有互补性。
The relationship between the chemical displacement of the binding energy and the different chemical environment for 12 organic tin compounds was studied by means of X ray photoelectron spectronscopy.The different substituents in the compounds have influence on the tin outer electron and Sn O bond,which was discussed by X ray photoelectron spectroscopy and mass spectrum.
出处
《光谱学与光谱分析》
SCIE
EI
CAS
CSCD
北大核心
1999年第2期142-144,共3页
Spectroscopy and Spectral Analysis