摘要
本文在宽的基体变化范围内对波长为0.081nm的连续散射X-射线进行了研究,表明质量衰减系数与连续散射强度之间不再遵守传统散射内标法所假定的反比例关系,而是呈一种幂函数关系。理论证明和实验结果一致。提出了用0.081nm处的散射强度的函数校正基体效应的方法,并用于地质样品中微量锶的测定,结果显示,在较大的基体变动范围内,本法与传统散射内标法相比准确度提高近4倍,克服了传统方法适应基体变化范围小的缺点。
The study in this paper shows that the relationship between mass attenuation coefficient and continuous scattering radiation at wavelength 0 081nm is not an inverse proportion supposed as the scattering internal standard method but a power function in a wide range of matix composition.Experimental results are in good agreement with that of theoretical prediction.A new method is recommended for matrix absorption correction using the 1 22 power function of continuous scattering radiation at wavelength 0 081nm and used for microelement Sr determination in geological samples as an application example.The accuracy of the results by this method is nearly 4 times better than that from the traditional scattering internal method in a wide range of matrix composition.
出处
《光谱学与光谱分析》
SCIE
EI
CAS
CSCD
北大核心
1999年第2期221-224,共4页
Spectroscopy and Spectral Analysis
关键词
连续散射
散射幂函数
基体校正
X射线荧光光谱
X ray fluorescence analysis
Continuous scattering radiation
Matrix correction