摘要
阐述了衡量高端磁盘阵列可靠性的重要指标MTTDL,通过分析两种造成磁盘错误的原因,建模计算了各种RAID级别的MTTDL,设计了磁盘读出错率的测试方案,实现了基于分布式的磁盘读出错率测试程序。
This paper introduces an important indicator of the reliability of high-reliability disk arrays—MTTDL,calculates MTTDL of the disk array constructed by various RAID levels by analyzing two reasons of the disk failure,designs BER（disk read error rate）testing schemea,nd implements disk read error rate testing program based on distribution.
出处
《计算机工程与应用》
CSCD
北大核心
2010年第36期82-84,132,共4页
Computer Engineering and Applications
基金
国家高技术研究发展计划(863)(No.2009AA01A405)~~
