摘要
介绍了一种以半导体激光器为光源，以新型ＣＭＯＳ面阵图象转换器件为传感器的智能型覆铜板测厚系统。该系统具有较高的测量精度和稳定性。
An intelligent coated plate thickness measurement system based on a semiconductor laser diode as light source and a CMOS image sensor is introduced.It has features of high precision and stability.
出处
《西安矿业学院学报》
CAS
1999年第2期169-172,共4页
Journal of Xi'an University of Science & Technology
关键词
半导体激光器
测厚系统
测量精度
laser diode
thickness measurement system
measuring precision
