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表面化学处理和退火对p-GaN/ZnO:Ga接触特性的影响 被引量:5

Effects of Surface Chemical Treatment and Annealing on p-GaN/ZnO:Ga Contact
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摘要 ZnO∶Ga(GZO)透明电极沉积在p-GaN表面,用作透明电流扩展层。直接沉积在p-GaN上的p-GaN/GZO存在较大的势垒,容易形成肖特基接触,而良好的欧姆接触对功率LED器件至关重要。为了降低接触势垒,采用盐酸和氢氧化钠溶液对GaN表面进行去氧化层处理,并对p-GaN/GZO进行退火处理,研究表面处理和退火对p-GaN/GZO接触特性的影响。研究表明:碱性溶液处理有利于降低接触势垒;退火处理后,接触势垒略有增加。 ZnO∶Ga(GZO) transparent conductive thin film was deposited on p-GaN acting as the current spreading layer,but it leads to a large contact barrier because of the formation of Schottky contact.However,ohmic contact is of great importance to powered LED.In order to decrease the contact barrier,HCl and NaOH treatment of the p-GaN surface and annealing were employed in this work.The effects of different chemical treatment and annealing on p-GaN/GZO contact property were studied.It is obvious that solutions of alkaline treatment of p-GaN surface can decrease the interfacial barrier,which led to ohmic contact,and the barrier can be lightly increased by annealing.
出处 《发光学报》 EI CAS CSCD 北大核心 2010年第6期848-853,共6页 Chinese Journal of Luminescence
基金 国家自然科学基金(51072111) 上海市科委发展基金(08DZ1140603 08QH14007) 教育部新世纪优秀人才支持计划(NCET-07-0535)资助项目
关键词 P-GAN ZnO:Ga透明电极 表面化学处理 接触特性 p-GaN surface chemical treatment ohmic contact ZnO: Ga transparent electrode
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参考文献25

  • 1Bhosle V,Tiwari A,Narayan J.Electrical properties of transparent and conducting Ga doped ZnO[J].J.Appl.Phys.,2006,100(3):033713-1-6.
  • 2Minami T.Present status of transparent conducting oxide thin-film development for indium-tin-oxide (ITO) substitutes[J].Thin Solid Films,2008,516(17):5822-5828.
  • 3Minami T.Substitution of transparent conducting oxide thin films for indium tin oxide transparent electrode applications[J].Thin Solid Films,2008,516(7):1314-1321.
  • 4Kim D H,Jeon H,Kim G,et al.Comparison of the optical properties of undoped and Ga-doped ZnO thin films deposited using RF magnetron sputtering at room temperature[J].Opt.Commun.,2008,281(8):2120-2125.
  • 5Suvorova N A,Usov O,Stan L,et al.Structural and optical properties of ZnO thin films by rf magnetron sputtering with rapid thermal annealing[J].Appl.Phys.Lett.,2008,92(14):141911-1-3.
  • 6程松华,曾祥斌.ZnO基薄膜晶体管的研究[J].液晶与显示,2006,21(5):515-520. 被引量:8
  • 7Tun C J,Sheu J K,Pong B J,et al.Enhanced light output of GaN-based power LEDs with transparent Al-doped ZnO current spreading layer[J].IEEE Photonics Technology Lett.,2006,18(1-4):274-276.
  • 8张化福,袁玉珍,刘云燕.柔性透明导电薄膜ZAO[J].液晶与显示,2008,23(4):489-493. 被引量:6
  • 9Sheu J K,Lu Y S,Lee M L,et al.Enhanced efficiency of GaN-based light-emitting diodes with periodic textured Gadoped ZnO transparent contact layer[J].Appl.Phys.Lett.,2007,90(26):263511-1-3.
  • 10Nakahara K,Tamura K,Sakai M,et al.Improved external efficiency InGaN-based light-emitting diodes with transparent conductive Ga-doped ZnO as p-electrodes[J].Jpn.J.Appl.Phys.,Part 2:Letters,2004,43(n2A):180-182.

二级参考文献88

共引文献19

同被引文献48

  • 1Ishikawa H, Kobayashi S, Koide Y, et al. Effects of surface treatments and metal work functions on electrical properties at p-GaN/metal interfaces [J]. J. Appl. Phys. , 1997, 81(3):1315-1322.
  • 2Koide Y, Maeda T, Kawakami T, et al. Effects of annealing in an oxygen ambient on electrical properties of Ohmic contacts to p-type GaN [J]. J. Electron. Mater. , 1999, 28(3) :341-346.
  • 3Kim H, Kim D J, Park S J, et al. Effect of an oxidized Ni/Au p contact on the performance of GaN/InGaN multiple quantum well light-emitting diodes [J]. J. Appl. Phys. , 2001, 89(2) :1506-1508.
  • 4Lee S H, Son H K, Kim S J, et al. High brightness GaN-based LEDs using ITO/n^+ -InGaN/InGaN superlattice/n^+-GaN/ p-GaN tunneling junction [J]. Phys. Star. Sol. (A), 2004, 201(12):2726-2729.
  • 5Horng R H, Wuu D S, Lien Y C, et al. Low-resistance and high-transparency Ni/ITO Ohmic contacts to p-type GaN [J]. Appl. Phys. Lett. , 2001, 79(18):2925-2927.
  • 6Kim S Y, Jang H W, Lee J L. Effect of an indium-tin-oxide overlayer on transparent Ni/Au Ohmic contact on p-type GaN [J]. Appl. Phys. Lett. , 2003, 82(1):61-63.
  • 7Pan S M, Tu R C, Fan Y M, et al. Enhanced output power of InGaN-GaN light-emitting diodes with high-transparency nickel-oxide-indium-tin-oxide ohmic contacts [ J ]. IEEE Photon. Technol. Lett. , 2003, 15 (5) :646-648.
  • 8Igasaki Y, Kanma H. Argon gas pressure dependence of the properties of transparent conducting ZnO: A1 films deposited on glass substrates [J]. Appl. Surfi. Sci., 2001, 169(170):508-511.
  • 9Nakahara K, Tamura K, Sakai M, et al. Improved external efficiency InGaN-based light-emitting diodes with transparent conductive Ga-doped ZnO as p-electrodes [J]. Jpn. J. Appl. Phys., 2004, 43(2A) :L180-L182.
  • 10Song J O, Kyong K, Seong J P, et al. Highly low resistance and transpartent Ni/ZnO Ohmic contacts to p-type GaN [J]. Appl. Phys. Lett. , 2003, 83(3):479-481.

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