X射线无损应力测试技术的研究现状

DEVELOPMENT OF X-RAY STRESS MEASUREMENT TECHNIQUES

论述20年来X射线应力测试技术的发展.着重介绍在粗晶、织构和有应力梯度情况下所存在的问题和措施;从衍射几何出发分析平行光束法和准聚焦法的异同,并根据测试对象的不同阐述常规法和侧倾法的应用;通过比较各种定峰方法,展示半高宽法和抛物线法的实用性;最后结合近年的研究工作,分析了X射线应力测试技术在工程上应用的情况.

Development of X-ray stress measurement techniques during the past few decades is reviewed. Residual stress measurement of the materials with coarse grains, crystallographic textures and stress gradients are emphasised. Parallel beam method and quasi-focusing beam method are analysed by diffracting geometry, and the applications of Ω-goniometer and ψ-goniometer methods are described. The advantages of half-width and parabola methods for determining the peak shift are discussed in comparison with the other methods. Finally, the applications of X-ray stress measurement in engineering are summarized.