摘要
本文介绍了可从0.7～4.0μm(1.77～0.31eV)进行波长扫描的光电流测试系统及其技术特点,测量了GaAs和InP样品的深能级,这些数据同有关文献测量的结果基本一致。
In this article the photocurrent method using illumination from 0. 7μm to 3. 5μm and its technical characteristic have been introduced. Deep levels of some samples,such as GaAs and InP,have been measured. The similar levels are also found in some other foreign articles.
出处
《现代仪器》
1999年第4期32-33,18,共3页
Modern Instruments
