杏低温薄层干燥试验与建模

Thin Layer Drying Model of Apricot at Low Temperature

在较低温度下采用旋转组合设计对杏进行了薄层干燥试验,考察了温度、风速对杏干燥特性的影响。试验结果表明在一定范围内温度是影响干燥速率的主要因素,通过试验值回归,确定杏在较低温度下的干燥模型为Wang-Singh方程,且模型系数与温度、风速有关。试验值与模型预测值比较说明,该模型能较好地描述干燥过程中杏的水分比与干燥时间的关系。

Thin layer drying experiments of apricot in low temperature were carried out on rotation design.The drying characteristics and the drying model of apricot were studied based on temperature and velocity of drying medium.The experiments showed that temperature was the main influencing factor in the drying process.The mathematical model was set as Wang-Singh equation at low temperature and the coefficients of the model were related to temperature and velocity.The established mathematical model could be used to describe the change regulation of moisture ratio well during the drying process of apricot according to the comparison of experimental values and calculated values.