摘要
分类讨论了半导体激光器热特性(温升)测量中所用的技术,介绍了各种技术的基本原理及其特点。
Technologies used for measuring the thermal characteristics of semiconductor lasers were discussed. Their basic principles, advantages and disadvantages were presented.
出处
《半导体光电》
CAS
CSCD
北大核心
2010年第6期834-837,944,共5页
Semiconductor Optoelectronics
关键词
半导体激光器
热特性
温升
semiconductor laser
thermal characteristic
temperature rise