XPS分析山柚柑木材中硅元素的分布

Silicon distribution in Acronychia Pedunculata by XPS analysis

以山柚柑(Acronychia pedunculata)作为研究树种,采用高温炉灰化法,将山柚柑木材样品灰化,利用X射线电子能谱仪(XPS)对灰化样品进行扫描,根据特征峰判定木材样品的矿质元素为硅。根据样品的硅、碳面积比,做半定量分析,分析样品硅元素的分布情况。结果表明:山柚柑样品中的硅元素轴向分布由下至上随高度呈减少趋势;径向分布从边材向心材呈增加趋势。

The Acronychia pedunculata is researched and analyzed the distributing of silicon in the paper.High-temperature furnace was used to incinerate wood samples and the content ratio of silicon to carbon was analyzed by XPS.Thereby,the distribution of silicon in Acronychia pedunculata was obtained.The result indicates the silicon content in Acronychia pedunculata reduced with tree height increasing and increased from sapwood to heartwood.