边界扫描结构的设计及仿真

The Design and Stimulation of Boundary Scan's Structure

在集成电路高速发展的今天,许多传统形式的测试技术受到越来越多的挑战。就测试技术本身而言,其作用和地位不再是集成电路生产的末端环节,而是作为一种前端环节对整个系统的设计都有着至关重要的作用,这就要求工程师在电路板设计之初就必须考虑后期的测试问题,即可测试性设计。边界扫描作为一种结构化的DFT技术,它的出现为集成电路板板级测试提供了一个更加先进和便捷的策略。剖析了支持边界扫描标准的芯片结构,并通过VHDL语言对其进行建模,完成边界扫描结构的软核设计及仿真。

With the rapid development of integrated circuit,many traditional test techniques are meeting more and more challenges.In terms of test technique,whose function and status are not as the end link of integrated circuit produces,but as the front end link plays the critical role in the whole system design,thus it requires engineers to consider the later test circumstance,which is named design for test,before the board is being designed.As a structural DFT technique,boundary scan provides a more advanced and convenient strategy solution for the test of integrated circuit.The structure of IC chip is analyzed which supports the standard of boundary scan,and tries to build a model by VHDL language.So,the soft core and stimulation of the boundary scan＇s structure are completed.