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Microstructure and variable emittance property of annealed La-Sr-Mn-O films

Microstructure and variable emittance property of annealed La-Sr-Mn-O films
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摘要 The La-Sr-Mn-O films were deposited on Si(100) substrates by DC magnetron sputtering and followed by air annealing at 973 K for I h. The microstructure and temperature dependence of total hemispherical emittance (εH) of the annealed La-Sr-Mn-O films prepared at various processing parameters were investigated. The results indicated the films deposited at lower sputtering pressure and lower O2(O2+Ar) volume proportion (R0) were present in rhombohedral .perovskite structure and the length of MnO bond was shorter. The metal-insulator transition temperature (TMI) was higher. All of the annealed films showed the unique feature of variable emittance based on metal-insulator transition. The films showed low emittance at low temperature but high emittance at high temperature. Moreover, the εH significantly changed in the vicinity of TMI. The variability of total hemispherical emittance (△ε) and the temperature range with obvious emittance change could be adjusted by changing the processing parameters. The Aε could be 0.45 and △ε/ε355 (ε355 is the εH at 355K) exceeded 50% for the annealed La-Sr-Mn-O films. Therefore, the annealed La-Sr-Mn-O films showed much potential for thermal control applications as smart thermochromic variable emittance materials. The La-Sr-Mn-O films were deposited on Si(100) substrates by DC magnetron sputtering and followed by air annealing at 973 K for I h. The microstructure and temperature dependence of total hemispherical emittance (εH) of the annealed La-Sr-Mn-O films prepared at various processing parameters were investigated. The results indicated the films deposited at lower sputtering pressure and lower O2(O2+Ar) volume proportion (R0) were present in rhombohedral .perovskite structure and the length of MnO bond was shorter. The metal-insulator transition temperature (TMI) was higher. All of the annealed films showed the unique feature of variable emittance based on metal-insulator transition. The films showed low emittance at low temperature but high emittance at high temperature. Moreover, the εH significantly changed in the vicinity of TMI. The variability of total hemispherical emittance (△ε) and the temperature range with obvious emittance change could be adjusted by changing the processing parameters. The Aε could be 0.45 and △ε/ε355 (ε355 is the εH at 355K) exceeded 50% for the annealed La-Sr-Mn-O films. Therefore, the annealed La-Sr-Mn-O films showed much potential for thermal control applications as smart thermochromic variable emittance materials.
出处 《Journal of Rare Earths》 SCIE EI CAS CSCD 2011年第1期83-86,共4页 稀土学报(英文版)
基金 Project supported by the Scientific Research Start-up Fund Project of Hohai University (20080403) Natural Science Fund of Hohai University (2008427911) Natural Scienctific Research Innovation Foundation in Harbin Institute of Technology (HIT NSRIF 2009030)
关键词 manganese oxide thin film thermal control variable emittance metal-insulator transition rare earths manganese oxide thin film thermal control variable emittance metal-insulator transition rare earths
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参考文献14

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