薄层地震响应分析及识别技术

Analysis of Seismic Response and Technique of Recognization in the Thin Layers

对薄层地震响应的振幅、频谱等特征进行了详细的分析，并分析了影响该地震响应波形特征的因素。同时，利用积分能谱技术对其进行处理，可以识别出薄层的厚度变化及透镜体的存在。实际应用表明，该项技术较常规的时频分析方法有更高的分辨能力。

In this paper, the detailed analysis has been given for the characteristics of amplitude and spectrum about complex wave in the thin layer, and some factors affecting the characteristics of complex wave have been defined. With the technique of integrated energy spectrum processing the complex wave, we may recognize the thickness of thin-layer sand and the existence of lenticular sand. The actual application indicates that the technique of integrated energy spectrum has higher resolution than other methods in recognizing the thin layers.