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交联聚乙烯绝缘中电树枝通道的Raman光谱分析 被引量:2

Raman Analysis of Electrical Tree in XLPE Cable Insulation
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摘要 采用共焦Raman光谱分析法对交联聚乙烯电缆绝缘发生击穿后的通道,以及在试验条件下加18 kV工频电压得到的电树枝的不同生长长度处树枝通道进行化学产物分析,最终获得了击穿通道产物的材料特性、击穿通道处有游离碳的特征峰谱线的存在,并依此判断电力绝缘发生击穿后绝缘材料被碳化,针尖附近亦测到游离碳的存在,但离针尖较远处的谱图上均没有测得碳峰,谱图上均有荧光背景存在,不同生长长度处电树枝通道的谱线含有不同的交联聚乙烯基带峰,表明材料发生裂解,并且随着电树枝的生长其裂解程度不同。 The structure and chemistry of the channel of electrical breakdown and electrical treewhich being grown under 50 Hz/18 kV have been studied by a combination of confocal Raman microprobe spectroscopy.In breakdown channel,it is found that there is disordered graphitic carbon,and their Raman bands stand for the graphitic sp2 G and D bands.In different length of electrical tree,the chemical products are different.First,near the pin,it is detected that there is disordered graphitic carbon, but the disordered graphitic carbon is not tested in any other place.It is also found that,for different length of electrical tree,the intensity of fluorescent decomposition products and peaks of Raman spectral band are not the same.From this,it can be indicated that the decomposition degree of the material is different with the electrical tree growth.
作者 史文 曹晓珑
出处 《绝缘材料》 CAS 北大核心 2010年第6期58-61,68,共5页 Insulating Materials
关键词 共焦Raman光谱分析仪 交联聚乙烯电缆绝缘 电树枝 化学分析 confocal Raman microprobe spectroscopy XLPE cable insulation electrical tree chemical analysis
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参考文献10

  • 1Hozumi N,Ishida M, Okamoto T,et al. The Influence of Morphology on Electrical Tree Initiation in the Polyethy lene Under AC and Impulse Voltages[C].Properties and Applications of Dielectric Materials Proceedings Second International Conference, YoKosuka - shi. 1988.
  • 2Danikas M G,Dissado L A,Champion J V,et al. Propagation of Electrical Tree Structures in Solid Polymeric Insulation[J] .Dielectrics and Electrical Insulation, IEEE Transactions on Dielectrics and Electrical Insulation, 1998, 5(3) :458 - 460.
  • 3Hozumi N, Okamoto T. The Initiation and Growth of AC Tree in Polyethylene[C]. Conduction and Breakdown in Solid Dielectrics Proceedings of the 3rd International Conference, Norway, 1989.
  • 4Champion J V, Dodd S J,Alison J,et al.E!ectrical Tree Growth and Space Charge Behaviour of Epoxy Resin Blends[C] .Conduction and Breakdown in Solid Dielectrics Proceediongs of the 1998 IEEE 6th International Conference, Sweden, 1998.
  • 5Auckland D W, Varlow B R. Electrical Treeing in Solid Polymeric Insulation[J ].Engineering Science and Education Journal, 1995, 4(1) : 11 - 16.
  • 6李胜涛,郑晓泉.聚合物电树枝化[M].北京:机械工业出版社,2006.
  • 7Champion J V,Dodd S J.Simulation of Partial Discharges in Conducting and Non - conducting Electrical Tree Structures[J ]. Phys. D : Appl. Phys, 2001, 34 : 1235 - 1242.
  • 8Vaughan A S,Hosier I L,Doddl S J,et al.On the Structure and Chemistry of Electrical Trees in Polyethylene [ J ]. Phys. D : Appl. Phys, 2006, 39 : 962 - 978.
  • 9Andersson M P,Uvdal P.Fundamentai, Binary Combination, and Overtone Modes in Methoxy Adsorbed on Cu (100): Infrared Spectroscopy and Ab Initio Calculations [J ]. Phys. Chem. B 2002, 106 : 5200- 5211.
  • 10Sayers PW. Investigation of the Structural Changes in LDPE and XLPE Induced by High Electrical Stress[C]. In Eighth International Conference on Dielectric Materials, Measurements and Applications, Edinburgh, 2002.

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同被引文献18

  • 1Du B X, Ma Z L, Gao Y, et al. Effect of Ambient Temper- ature on Electrical Treeing Characteristics in Silicone Rubber [J]. IEEE Transactions on Dielectrics and Electrical Insula-tion,2011,18(2):401-407.
  • 2Du B X, Ma Z L, Gao Y. Effect of Temperature on Elec- trical Tree in Silicone Rubber[C]//Intemational Conference on Solid Dielectrics,Potsdam,Gerrnany,2010:1-4.
  • 3Noto F, Yoshimura N. Voltage and Frequency Dependence of Tree Growth in Polyethylene[C]//IEEE Conference Elec- trical Insulation Dielectrical Phenomena(CEIDP), 1974: 206-217.
  • 4Densley R J. An Investigation into the Growth of Electri- cal Trees in XLPE Cable Insulation[J]. IEEE Transactions on Dielectrics and Electrical Insulation,1979,14(3):148-158.
  • 5Laurent C, Mayoux C. Analysis of the Propagation of Elec- trical Treeing Using Optical and Electrical Methods[J]. IEEE Transactions on Dielectrics and Electrical Insulation, 1980,15(1):33-42.
  • 6Lewis T J. Nanometric Dielectrics[J]. IEEE Transactions onDielectrics and Electrical Insulation,1994,1(5):812-825.
  • 7Venkatesulu B, Thomas M J. Corona Aging Studies on SillioneRubber Nanocomposites[J]. IEEE Transactions on DielectricsElectrical Insulation,2010,17(2):625-634.
  • 8Michael G. Danikas, Toshikatsu Tanaka. Nanocomposites-AReview of Electrical Treeing and Breaksown[J].IEEE ElectricalInsulation Magazine,2009,25(4):19-24.
  • 9Du B X, Ma Z L, Gao Y, et al. Effect of Ambient Temperatureon Electrical Treeing Characteristics in SiliconeRubber[J]. IEEE Transactions on Dielectrics and ElectricalInsulation,2011,18(2):401-407.
  • 10Du B X, Ma Z L, Gao Y. Effect of Temperature on ElectricalTree in Silicone Rubber[C]//International Conferenceon Solid Dielectrics,Potsdam,Germany,2010:1-4.

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