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Effect of Temperature on the Electronic Current of AIGaN/GaN High Electron Mobility Transistors (HEMT)

Effect of Temperature on the Electronic Current of AIGaN/GaN High Electron Mobility Transistors (HEMT)
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机构地区 Department of Physics
出处 《材料科学与工程(中英文版)》 2011年第2期155-160,共6页 Journal of Materials Science and Engineering
AIGaN/GaN, mobility, threshold voltage, temperature.
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参考文献22

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