Magnetic Exchange Bias and Its Ion Beam Induced Enhancement in a Nanoscale Si/Co/Si System
Magnetic Exchange Bias and Its Ion Beam Induced Enhancement in a Nanoscale Si/Co/Si System
出处
《材料科学与工程（中英文版）》
2011年第2期200-211,共12页
Journal of Materials Science and Engineering
Thin film, magnetic exchange bias, X-ray reflectivity, ion irradiation induced modifications, Co-Si alloy.
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