期刊文献+
任意字段
题名或关键词
题名
关键词
文摘
作者
第一作者
机构
刊名
分类号
参考文献
作者简介
基金资助
栏目信息

电源系统抗伽玛总剂量辐射能力评估方法 被引量：5

Assessment method of gamma-dose radiation hardness of power supply system
下载PDF
导出
摘要 为了评估某电源系统抗伽玛总剂量辐射能力,研究了评估电子系统抗伽玛总剂量辐射能力的QMU方法。为获得应用QMU方法所需的输入量,提出了以蒙特卡罗方法和SPICE电路模拟相结合的分析方法,用以确定受伽玛辐照后系统性能参数的裕量及不确定度。应用QMU方法对电源系统抗伽玛总剂量能力进行了评估,将评估结果和实验结果进行了比较,验证了方法的可行性。 The quantification of margins and uncertainties（QMU） method is analyzed,which is used to assess the radiation hardness of the electronic system.In order to use the QMU method,a procedure based on Monte Carlo method and SPICE circuit simulator is proposed to evaluate the margin and uncertainty of the system＇s output.The radiation hardness of a power supply system is assessed,and the assessed results are in good agreement with those obtained experimentally.
作者 范如玉 韩峰 郭红霞
机构地区 西北核技术研究所
出处 《强激光与粒子束》 EI CAS CSCD 北大核心 2011年第2期536-540,共5页 High Power Laser and Particle Beams
关键词 电子系统 抗辐射能力 评估方法 QMU方法 蒙特卡罗方法 electronics system radiation hardness assessment method quantification of margins and uncertanties Monte Carlo simulation
分类号 O6-0 [理学—化学]
  • 相关文献

参考文献10

  • 1冯彦君,华更新,刘淑芬.航天电子抗辐射研究综述[J].宇航学报,2007,28(5):1071-1080. 被引量：70
  • 2Pease R L. Total ionizing dose effects in bipolar devices and circuits[J]. IEEE Trans on Nuclear Science, 2003,50(3) :539-551.
  • 3Kutkarni R D, Agarwal V. Reliability analysis of a modern power supply under nuclear radiation effects[C]//The Fifth International Confe rence on Power Electronics and Drive Systems, 2003:71-76.
  • 4Sergey N R, Claude R C. Daniel M F et al. Physical model for enhanced interface trap formation at low dose rates[J]. IEEEtrans on Nuclear Science, 2002, 49(6) :2650-2655.
  • 5MIL-HANDBOOK-814[K]. Ionizing dose and neutron hardness assurance guidelines for microcircuits and semiconductor devices, 1994.
  • 6Sharp D H, Wood S M. QMU and nuclear weapons certification[R]. Los Alamos Science:Number 28, 2003:47-53.
  • 7McCoy D R. Weapon Certification:A personal view[R]. Los Alamos Science:Number 28, 2003: 54-57.
  • 8Pilch M, Trucano T G. Hehon J C. Ideas underlying quantification of margins and uncertainties (QMU): A white paper[R]. SAND-2006- 5001.2006.
  • 9马智博,应阳君,朱建士.QMU认证方法及其实现途径[J].核科学与工程,2009,29(1):1-9. 被引量：11
  • 10叶德培.测量不确定度[M].北京:国防工业出版社,2001:1-3.

二级参考文献37

  • 1Katie Walter. Quantifying Margins and Uncertainties: A Better Method for Certifying the Nuclear Stockpile[R]. S&TR, March 2004:19-21.
  • 2McCoy Donald R. A Personal View: Weapon Certification[R]. Los Alamos Science, Number 28,2003 : 54-57.
  • 3Sharp David H, Wood-Schultz Merri M. QMU and Nuclear Weapons Certification[R]. Los Alamos Science, Number 28, 2003:47 5:3.
  • 4Trucano Timothy G. Uncertainty Quantification Whitepaper "Uncertainty Quantification and the Department of Homeland Security"[R]. SAND2004-2411P.
  • 5Helton J S. Treatment of Uncertainty in Performance Assessments for complex Systems[J]. Risk Analysis, 1994, 14(4) :483-511.
  • 6Chadwick Mark B, Patrick Talou, Toshihiko Kawano. Reducing Uncertainty in Nuclear Data[R]. Los Alamos Science, Number 29, 2005: 26-41.
  • 7Hemez Francois M. An Information - Gap View of system Certification at Los Alamos[R]. LA-UR-05-7429.
  • 8Najm H N , etc. Uncertainty Quantification in Reacting Flow Modeling[R]. SAND2003-8598.
  • 9Hanson Kenneth M, Hemez Francois M. Uncertainty Quantification of Simulation Codes Based on Experimental Data[R]. LA-UR-03-0171.
  • 10Oberkampf William L, etc. Estimation of Total Uncertainty in Modeling and Simulation [R]. SAND2000- 0824.

共引文献85

同被引文献28

  • 1冯彦君,华更新,刘淑芬.航天电子抗辐射研究综述[J].宇航学报,2007,28(5):1071-1080. 被引量：70
  • 2王广彦,马志军,胡起伟.基于贝叶斯网络的故障树分析[J].系统工程理论与实践,2004,24(6):78-83. 被引量：98
  • 3Pease R L. Total ionizing dose effects in bipolar devices and circuits[J]. IEEE Transactions on Nuclear Science, 2008, 50(3) : 539-551.
  • 4Kulkarni R D, Agarwal V. Reliability analysis of a modern power supply under nuclear radiation effects[C]//Fifth International Conference on Power Electronics and Drive Systems. 2003: 71-76.
  • 5Hughes H L, Benedetto J M. Radiation effects and hardening of MOS technology: devices and circuits[J]. IEEE Transactions on Nuclear Science, 2003, 50(3): 500-521.
  • 6MIL-HDBK-814[S]. Ionizing dose and neutron hardness assurance guidelines for microcircuits and semiconductor devices, 1994.
  • 7Marc F, Mongellaz B, Bestory C, et al. Improvement of aging simulation of electronic circuits using behavioral modeling[J]. IEEE Trans- actions on Materials Reliability, 2006, 6(2) : 228-234.
  • 8Mikkola E O, Vermeire B, Parks H G, et al. VHDL-AMS modeling of total ionizing dose radiation effects on CMOS mixed signal circuits [J]. IEEE Transactions on Nuclear Science, 2007, S4(4) : 929-934.
  • 9Tu R, Lum G, Pavan P, et al. Simulating total-dose radiation effects on circuit behavior[C]//Proc IEEE 32nd Annu Int Reliability Physics Symp. i994: 344-350.
  • 10Sharp D H, Wood Schultz M M. QMU and nuclear weapons certification[J]. LosAlamos Science, 2003(28): 47-53.

引证文献5

二级引证文献14

强激光与粒子束
2011年 第2期

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部