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ΔV_(BE)测试在产线的应用

ΔV_(BE) Test Apply in the Product Line
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摘要 产品在封装过程中往往存在一定的缺陷需要我们在测试时加以筛选出来,而热阻对晶体管的可靠性有着重要影响,我们利用晶体管ΔVBE参数与热阻在一定条件下满足一定的关系,通过对晶体管ΔVBE参数的测试从而间接地测试热阻参数,实现对封装产品的质量控制,具有测量效率高、测试成本低、对器件无损伤等优点。文章主要描述产品在生产过程中存在的缺陷,引入ΔVBE的测试需求,介绍了ΔVBE测试的主要技术参数,ΔVBE的测试流程和ΔVBE测试在产线的实际应用。我们通过ΔVBE的测试来减少产品的缺陷,提高产品的可靠性,提高产品的质量,从而满足客户需求,增强企业的竞争力。 Usually the transistor products have a part of objections in the assembly line work,And we need to screen out during the test.The thermal resistance has significant impacts on the reliability of the transistor.We can use the relationship between ΔVBE and thermal resistance of the transistor under certain conditions.The value of thermal resistance can be calculated based on the algorithm by measuring ΔVBE characteristics of the transistor.And we can realize the quality contral of the transistor by test.This new technique makes the measurement of the thermal resistance more efficient with lost cost,and no damges on device under test.This text mostly describe the existent objection during the production manufacture,we introduce the need of the ΔVBE test,and introduce the mainly technology parameter of the ΔVBE test,the flow of the ΔVBE test,and the ΔVBE test aplly in the product line.We can decrease the objection of product by theΔVBE test.It can improve the production reliability and the production quality,and accordingly meet the requirement of the client,gather head the rivalrousness of the corporation.
作者 陈菊华
出处 《电子与封装》 2011年第2期9-11,25,共4页 Electronics & Packaging
关键词 ΔVBE 热阻 封装 ΔVBE thermal resistance encapsulation
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参考文献3

  • 1TESTER 9614-KT/9615-PU.THERMAL RESISTANCE Δ V BE/Δ V DS/Δ V GS/Δ V F TESTER INSTRUCTION MANUAL TESEC Corporation 391-1,kamiktadai 3-chome Higashiyamato,Tokyo.
  • 2何绍木,何纪法,周路.晶体管热阻测试系统的设计与实现[J].微计算机信息,2007,23(19):195-196. 被引量:1
  • 3Rao R.Tummakla,Eugene J.Kynoszeweski,Alan G,Klopfenstein.MICROELECTRONICS PACKING HANDBOOK[M].

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